Min-Tar Liu

Title: Min-Tar Liu: Innovator in Semiconductor Testing Technologies

Introduction

Min-Tar Liu is a prominent inventor based in Jhubei, Taiwan. He has made significant contributions to the field of semiconductor testing, holding a total of five patents. His work focuses on advancing the methodologies used in measuring devices within through-silicon vias.

Latest Patents

One of Min-Tar Liu's latest patents is a system and method for measuring devices inside through-silicon via surroundings. This invention describes a testing apparatus that includes an advanced process control monitor (APCM) situated in a first wafer. A plurality of pads are disposed over and coupled to the APCM, with these pads located in a second wafer. The testing apparatus features a testing unit positioned between the first and second wafers, which is also coupled to the APCM. The testing unit comprises a metal structure within a dielectric, and it includes multiple through-silicon vias (TSVs) extending from the first wafer, through the dielectric of the testing unit, to the second wafer.

Career Highlights

Min-Tar Liu is currently employed at Taiwan Semiconductor Manufacturing Company Limited, where he continues to innovate in semiconductor technologies. His expertise in testing apparatus design has positioned him as a key figure in the industry.

Collaborations

Min-Tar Liu has collaborated with notable coworkers, including Yuan-Yao Chang and Shuo-Wen Chang, contributing to various projects that enhance semiconductor testing methodologies.

Conclusion

Min-Tar Liu's contributions to the field of semiconductor testing are noteworthy, particularly through his innovative patents and collaborations. His work continues to influence advancements in the industry, showcasing the importance of innovation in technology.