The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Oct. 04, 2010
Applicants:

Min-tar Liu, Jhubei, TW;

Chih-chiang Chang, Taipei, TW;

Chu-fu Chen, Zhubei, TW;

Ping-hsiang Huang, Taichung, TW;

Inventors:

Min-Tar Liu, Jhubei, TW;

Chih-Chiang Chang, Taipei, TW;

Chu-Fu Chen, Zhubei, TW;

Ping-Hsiang Huang, Taichung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01R 31/28 (2006.01); H03K 17/96 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01); G01R 27/2605 (2013.01); H03K 17/962 (2013.01);
Abstract

A capacitor measurement circuit for measuring a capacitance of a test capacitor includes a first transistor with a first source-drain path coupled between a first capacitor plate of the test capacitor and a ground; a second transistor with a second source-drain path coupled between a second capacitor plate of the test capacitor and the ground; and a current-measuring device configured to measure a first charging current and a second charging current of the test capacitors. The first and the second charging currents flow to the test capacitor in opposite directions.


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