Kanagawa, Japan

Miho Uno

USPTO Granted Patents = 5 

Average Co-Inventor Count = 3.9

ph-index = 1


Company Filing History:


Years Active: 2017-2024

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5 patents (USPTO):

Title: Miho Uno: Innovator in Surface Inspection Technology

Introduction

Miho Uno is a prominent inventor based in Kanagawa, Japan. She has made significant contributions to the field of surface inspection technology, holding a total of five patents. Her work focuses on enhancing the quality and efficiency of surface inspections through innovative apparatus and methods.

Latest Patents

Uno's latest patents include a surface inspection apparatus, a non-transitory computer-readable medium storing a program, and a surface inspection method. The surface inspection apparatus is designed to image the surface of an object to be inspected. It features an imaging device that captures images and a processor that calculates a numerical value representing the quality of the surface. This processor also receives changes in the range used to calculate the numerical value indicated by an index in the image. Another aspect of her patent involves notifying users about the relationship between the orientation of a pattern on the surface and the direction of imaging, which enhances the sensitivity of detection by the imaging device.

Career Highlights

Throughout her career, Miho Uno has worked with notable companies such as Fujifilm Business Innovation Corporation and Fuji Xerox Co., Ltd. Her experience in these organizations has allowed her to develop and refine her innovative ideas in surface inspection technology.

Collaborations

Uno has collaborated with several professionals in her field, including Yoshitaka Kuwada and Kiyofumi Aikawa. These collaborations have contributed to her success and the advancement of her inventions.

Conclusion

Miho Uno's contributions to surface inspection technology demonstrate her innovative spirit and dedication to improving quality assurance processes. Her patents reflect her expertise and commitment to advancing technology in this critical area.

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