The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2024
Filed:
Nov. 03, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventors:
Takashi Hiramatsu, Kanagawa, JP;
Kaito Tasaki, Kanagawa, JP;
Kiyofumi Aikawa, Kanagawa, JP;
Miho Uno, Kanagawa, JP;
Hirokazu Ichikawa, Kanagawa, JP;
Yoshitaka Kuwada, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/40 (2017.01); G06T 7/00 (2017.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/40 (2013.01); G06T 11/60 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and receive a change in a range used to calculate the numerical value indicated by an index in the image.