Fujifilm Business Innovation Corp.

Fuji Xerox Co., Ltd.

Miho Uno

Yoshitaka Kuwada

Kiyofumi Aikawa

Hirokazu Ichikawa

Takashi Hiramatsu

Kaito Tasaki

Hiroko Onuki

Shinji Sasahara

Kazuya Fukunaga

A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and receive a change in a range used to calculate the numerical value indicated by an index in the image.

Surface inspection apparatus, non-transitory computer readable medium storing program, and surface inspection method

A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and notify a user of information indicating a relationship between a first orientation of a pattern on the surface detected from the image and a second orientation that gives a direction of imaging in which a sensitivity of detection by the imaging device is high.

A surface inspection apparatus includes an imaging device that images a surface of an object to be inspected; and a processor configured to: calculate a texture of the object through processing of an image imaged by the imaging device; and display a symbol representing the texture of the object at a coordinate position on a multidimensional distribution map.

The disclosure provides a surface inspection apparatus for inspecting a surface of an object, a non-transitory computer readable medium thereof, and a surface inspection method thereof. According to an aspect of the disclosure, the surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and display, on a display device, the image including an index for specifying a position of a portion that has contributed to the calculation of the numerical value and the numerical value.

Provided is an image evaluation device including an acquisition unit that acquires an image including plural patterns having different spatial frequencies and contrasts, and an output unit that compares each of plural patterns included in the image acquired by the acquisition unit with each of plural ideal patterns corresponding to the plural patterns, calculates similarities therebetween, and outputs an evaluation value for evaluating performance regarding a resolution of the image based on a sum of the calculated similarities of the plural patterns.

Growing community of inventors

Kanagawa, Japan

Miho Uno