The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Nov. 02, 2021
Fujifilm Business Innovation Corp., Tokyo, JP;
Kiyofumi Aikawa, Kanagawa, JP;
Takashi Hiramatsu, Kanagawa, JP;
Kaito Tasaki, Kanagawa, JP;
Miho Uno, Kanagawa, JP;
Hirokazu Ichikawa, Kanagawa, JP;
Hiroko Onuki, Kanagawa, JP;
Yoshitaka Kuwada, Kanagawa, JP;
FUJIFILM Business Innovation Corp., Tokyo, JP;
Abstract
A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and notify a user of information indicating a relationship between a first orientation of a pattern on the surface detected from the image and a second orientation that gives a direction of imaging in which a sensitivity of detection by the imaging device is high.