The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Oct. 31, 2021
Fujifilm Business Innovation Corp., Tokyo, JP;
Takashi Hiramatsu, Kanagawa, JP;
Kaito Tasaki, Kanagawa, JP;
Kiyofumi Aikawa, Kanagawa, JP;
Miho Uno, Kanagawa, JP;
Hirokazu Ichikawa, Kanagawa, JP;
Hiroko Onuki, Kanagawa, JP;
Yoshitaka Kuwada, Kanagawa, JP;
FUJIFILM Business Innovation Corp., Tokyo, JP;
Abstract
The disclosure provides a surface inspection apparatus for inspecting a surface of an object, a non-transitory computer readable medium thereof, and a surface inspection method thereof. According to an aspect of the disclosure, the surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and display, on a display device, the image including an index for specifying a position of a portion that has contributed to the calculation of the numerical value and the numerical value.