Location History:
- Ashqelon, IL (2010 - 2023)
- Rehovot, IL (2024)
Company Filing History:
3 out of 51 
1 out of 188 
2 out of 832,680 Years Active: 2010-2024
Title: **Michael Shifrin: Innovator in Advanced Metrology Techniques**
Introduction
Michael Shifrin is a notable inventor based in Ashqelon, Israel, renowned for his contributions to the field of metrology. With a total of five patents to his name, he has dedicated his career to developing innovative methods that enhance the accuracy of measurements in three-dimensional patterned structures. His work significantly impacts industries relying on precise metrology techniques.
Latest Patents
Among Michael's latest inventions are two groundbreaking patents related to metrology methods and systems. The first patent features a TEM-based metrology method designed to determine parameters of a three-dimensional patterned structure. This method involves a fitting procedure using measured TEM image data and simulated TEM image data, ultimately deriving the measured Lamellae position based on the best-fit condition between both data sets. The outcome facilitates the accurate determination of the structure's parameters.
His second patent similarly focuses on metrology methods, providing an advanced approach to identifying parameters through a fitting procedure between raw measured TEM image data and predetermined simulated TEM image data. This methodology incorporates simulated weight maps for different features of the patterned structure, allowing for precise parameter extraction from the best-fit condition.
Career Highlights
Throughout his career, Michael Shifrin has made significant strides in the field of metrology. His innovative approaches have led to patents that are at the forefront of research and development. His keen focus on enhancing measurement accuracy has garnered attention and respect within the scientific community.
Collaborations
Michael has had the privilege of collaborating with other talented individuals in his field. Notable coworkers include Vladimir Machavariani and Daniel Kandel, with whom he has worked closely to advance their shared goals in metrology research and development.
Conclusion
Michael Shifrin stands out as a prominent inventor dedicated to advancing metrology techniques. His innovative patents demonstrate his commitment to precision and accuracy in measurement systems. As he continues to push the boundaries of technology, Michael's contributions are set to shape the future of metrology and inspire future generations of inventors.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.