Company Filing History:
2 out of 2 
1 out of 38 
1 out of 786 Years Active: 1989-1999
Title: The Innovations of Michael P Watts
Introduction
Michael P Watts is a notable inventor based in Portola Valley, CA. He holds a total of 6 patents that showcase his contributions to the field of optical computing and integrated circuit testing. His work has significantly advanced the technology used in high-speed and high-resolution inspections.
Latest Patents
One of his latest patents involves a system for high-speed, high-resolution, large area inspection using multiple optical Fourier transform cells. This innovative system allows for simultaneous scanning of a device under test, providing high resolution while maintaining a wide coverage area and fast inspection speed. The design incorporates multiple Fourier transform cells that are offset from each other, ensuring complete coverage during scanning. The collimated illumination used in this system makes it insensitive to focusing errors, enhancing its reliability.
Another significant patent by Watts is a prober and tester with a contact interface for integrated circuits. This tester is designed for semiconductor wafers or substrates and features a vertically oriented performance board with D/A converters. The prober includes a vertical array of connector pins and a vertically-mounted chuck that holds the wafer or substrate in place. This innovative design allows for efficient testing by ensuring that the probe needles make contact with the integrated circuits on the wafer.
Career Highlights
Throughout his career, Michael P Watts has worked with various companies, including Pixel Systems, Inc. His expertise in optical computing and integrated circuit testing has made him a valuable asset in the technology sector.
Collaborations
Watts has collaborated with notable individuals in his field, including David W Myers and Robert G Ozarski. Their combined efforts have contributed to the advancements in the technologies they have developed.
Conclusion
Michael P Watts is a distinguished inventor whose work in optical computing and integrated circuit testing has led to significant innovations. His patents reflect his commitment to advancing technology and improving inspection processes.