The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1997
Filed:
Jul. 21, 1995
Michael P Watts, Portola Valley, CA (US);
Lawrence Hendler, Cupertino, CA (US);
Electroglas, Inc., Santa Clara, CA (US);
Abstract
A tester for testing integrated circuits-containing semiconductor wafers or substrates, includes a vertically oriented performance board with. D/A converters mounted and pin connected immediately therebehind. A prober including a vertical array of connector pins mounts a vertical probe card and a vertically-mounted chuck on which a vertically-oriented wafer or substrate is held. One of the tester and prober are moved with respect to the other to dock and latch the tester and prober together. Simultaneously the array of connector pins is electrically connected to electrical connectors on the performance board and probe needles extending from a probe board on the probes are placed into test contact with contact pads on the integrated circuits on the wafer or substrate.