For the Inventor, By the Inventor

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San Jose, CA, United States of America

Electroglas, Inc.

USPTO Granted Patents = 38

% Expired Patents = 28.9

Trademarks = 1

Forward Citations = 1,207

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35 inventors (with patents filed for the assignee):

Timothy J Boyle (8 out of 9 patents)

Wayne E Richter (8 out of 8 patents)

Ladd T Johnson (8 out of 11 patents)

4. Lawrence A Tom (8 out of 8 patents)

5. Jacques L Roch (7 out of 9 patents)

6. Paul C Colby (5 out of 5 patents)

7. John A Penkethman (4 out of 5 patents)

8. Uday G Nayak (4 out of 13 patents)

9. Max Jedda (2 out of 4 patents)

10. Raymond G White (2 out of 2 patents)

11. Tex M Dudley (2 out of 3 patents)

12. Ning San Chang (2 out of 3 patents)

13. Richard James Casler, Jr (1 out of 32 patents)

14. George Asmerom (1 out of 3 patents)

15. Xiaoming Wang (1 out of 7 patents)

38 patents: Sort by Forward Citations

1. 7453260 - Testing circuits on substrate (2008-11-18),

2. 7368929 - Methods and apparatuses for improved positioning in a probing system (2008-05-06),

3. 7362116 - Method for probing impact sensitive and thin layered substrate (2008-04-22),

4. 7352198 - Methods and apparatuses for improved stabilization in a probing system (2008-04-01),

5. 7345466 - Method and apparatus for cleaning a probe card (2008-03-18),

6. 7259548 - Testing circuits on substrate (2007-08-21),

7. 7180284 - Testing circuits on substrates (2007-02-20),

8. 7098649 - Testing circuits on substrates (2006-08-29),

9. 7002337 - Testing circuits on substrates (2006-02-21),

10. 6861859 - Testing circuits on substrates (2005-03-01),

11. 6781394 - Testing circuits on substrate (2004-08-24),

12. 6771060 - Testing circuits on substrates (2004-08-03),

13. 6756801 - Apparatus for electrical testing of a substrate having a plurality of terminals (2004-06-29),

14. 6711304 - Method and apparatus for measuring angular rotation of an object (2004-03-23),

15. 6668076 - Apparatus and method for projecting an alignment image (2003-12-23),

Electroglas, Inc. is a leading provider of precision wafer probers used in the semiconductor industry. They specialize in developing advanced testing solutions to improve semiconductor manufacturing processes. With a range of innovative products, Electroglas offers reliable and efficient solutions to enhance wafer testing efficiency and yield. Visit their website for more information.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Sep 22 2026

38 Patents

#229 in San Jose, CA

#2,127 in California

#9,008 in US

#17,797 in the World

San Jose, CA, United States of America

Electroglas, Inc.

Forward Citations = 1,207

35 inventors:

Timothy J Boyle (8 out of 9 patents)

Wayne E Richter (8 out of 8 patents)

Ladd T Johnson (8 out of 11 patents)

4. Lawrence A Tom (8 out of 8 patents)

5. Jacques L Roch (7 out of 9 patents)

Please report any incorrect information to [email protected]

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