For the Inventor, By the Inventor

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San Jose, CA, United States of America

Electroglas, Inc.

USPTO Granted Patents = 38

% Expired Patents = 28.9

Trademarks = 1

Forward Citations = 1,207

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35 inventors (with patents filed for the assignee):

Timothy J Boyle (8 out of 9 patents)

Wayne E Richter (8 out of 8 patents)

Ladd T Johnson (8 out of 11 patents)

4. Lawrence A Tom (8 out of 8 patents)

5. Jacques L Roch (7 out of 9 patents)

6. Paul C Colby (5 out of 5 patents)

7. John A Penkethman (4 out of 5 patents)

8. Uday G Nayak (4 out of 13 patents)

9. Max Jedda (2 out of 4 patents)

10. Raymond G White (2 out of 2 patents)

11. Tex M Dudley (2 out of 3 patents)

12. Ning San Chang (2 out of 3 patents)

13. Richard James Casler, Jr (1 out of 32 patents)

14. George Asmerom (1 out of 3 patents)

15. Xiaoming Wang (1 out of 7 patents)

Core Competencies:

Probe Testing

Substrate Testing

Positioning Systems

Angular Rotation

Electrical Testing

Cleaning Probe Cards

High Speed Chuck

Optical Recognition

Microcircuit Testing

Damping Control

Alignment Projection

Impact Sensitive Probing

38 patents: Sort by Forward Citations

1. 7453260 - Testing circuits on substrate (2008-11-18),

2. 7368929 - Methods and apparatuses for improved positioning in a probing system (2008-05-06),

3. 7362116 - Method for probing impact sensitive and thin layered substrate (2008-04-22),

4. 7352198 - Methods and apparatuses for improved stabilization in a probing system (2008-04-01),

5. 7345466 - Method and apparatus for cleaning a probe card (2008-03-18),

6. 7259548 - Testing circuits on substrate (2007-08-21),

7. 7180284 - Testing circuits on substrates (2007-02-20),

8. 7098649 - Testing circuits on substrates (2006-08-29),

9. 7002337 - Testing circuits on substrates (2006-02-21),

10. 6861859 - Testing circuits on substrates (2005-03-01),

11. 6781394 - Testing circuits on substrate (2004-08-24),

12. 6771060 - Testing circuits on substrates (2004-08-03),

13. 6756801 - Apparatus for electrical testing of a substrate having a plurality of terminals (2004-06-29),

14. 6711304 - Method and apparatus for measuring angular rotation of an object (2004-03-23),

15. 6668076 - Apparatus and method for projecting an alignment image (2003-12-23),

Company Overview

Electroglas, Inc. is a technology company based in San Jose, California, specializing in advanced semiconductor manufacturing equipment. The company is known for its innovative solutions in the field of automated test equipment and wafer probing systems, which are essential for the production and testing of integrated circuits. Electroglas focuses on enhancing the efficiency and accuracy of semiconductor processes, contributing to the broader electronics industry with its cutting-edge technologies and expertise.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

38 Patents

#229 in San Jose, CA

#2,133 in California

#9,027 in US

#17,844 in the World

San Jose, CA, United States of America

Electroglas, Inc.

Forward Citations = 1,207

35 inventors:

Timothy J Boyle (8 out of 9 patents)

Wayne E Richter (8 out of 8 patents)

Ladd T Johnson (8 out of 11 patents)

4. Lawrence A Tom (8 out of 8 patents)

5. Jacques L Roch (7 out of 9 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Electroglas, Inc.. Retrieved from https://idiyas.com/company/electroglas

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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