The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Jul. 27, 2004
Timothy J. Boyle, Cupertino, CA (US);
Wayne E. Richter, San Jose, CA (US);
Ladd T. Johnson, Scotts Valley, CA (US);
Lawrence A. Tom, Sunnyvale, CA (US);
Timothy J. Boyle, Cupertino, CA (US);
Wayne E. Richter, San Jose, CA (US);
Ladd T. Johnson, Scotts Valley, CA (US);
Lawrence A. Tom, Sunnyvale, CA (US);
Electroglas, Inc., San Jose, CA (US);
Abstract
The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.