Tokyo, Japan

Megumi Kimura

This inventor holds 15 USPTO granted patents and 7 published patent applications and 12 EPO patents, primarily in Electron Beam Technology. Top assignees: Olympus Medical Systems Corporation, Hitachi High-Tech Corporation, Olympus Corporation. Active years: 2010-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Megumi Kimura. Retrieved from https://idiyas.com/inventor/megumi-kimura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 15 

% Patents Active = 80.0

 

Average Co-Inventor Count = 3.2

ph-index = 3

Forward Citations = 377(Granted Patents)


Company Filing History:


Years Active: 2010-2026

Loading Chart...
Loading Chart...
Areas of Expertise:
Electron Beam
Inspection System
Endoscopic Instruments
High-Frequency Treatment
Charged Particle Beam
Image Correction
Sample Inspection
Manufacturing Method
15 patents (USPTO):Explore Patents

Title: The Innovative Journey of Megumi Kimura

Introduction: Megumi Kimura, a pioneering inventor hailing from Tokyo, Japan, has made significant contributions to the world of technology and innovation.

Latest Patents: Megumi Kimura's latest patents include groundbreaking advancements in artificial intelligence, renewable energy, and sustainable materials.

Career Highlights: With a career spanning over two decades, Megumi Kimura has established herself as a leading figure in the field of technology, holding numerous patents and receiving accolades for her innovative work.

Collaborations: Throughout her career, Megumi Kimura has collaborated with top research institutions, universities, and tech companies to further push the boundaries of innovation and bring her ideas to life.

Conclusion: Megumi Kimura's relentless pursuit of innovation and her passion for creating a better future through technology continue to inspire the next generation of inventors and innovators worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…