Olympus Medical Systems Corporation

Olympus Corporation

Hitachi, Ltd.

Hitachi High-tech Corporation

Srj Corporation

Megumi Kimura

Keita Suzuki

Momoyo Enyama

Koichi Hamada

Makoto Sakakibara

Tatsuya Kaneko

Satoru Yamaguchi

Kenji Fujiwara

Ichiro Takahashi

Kei Sakai

Ryou Yumiba

Hironori Yamamoto

Yasunari Sohda

Tetsuya Yamamoto

Kazuya Sato

Hiroyoshi Watanabe

Katsumi Setoguchi

Kazunari Kagawa

Yasunori Takasugi

Yasuhiro Tabuchi

Masumi Shirai

Yohei Yoshida

Ryoko Yamazaki

The objective of the present invention is to reduce differences between individual electron beam observation devices accurately by means of image correction. This method for calculating a correction factor for correcting images between a plurality of electron beam observation devices, in electron beam observation devices which generate images by scanning an electron beam across a specimen, is characterized by including: a step in which a first electron beam observation device generates a first image by scanning a first electron beam across first and second patterns, on either a specimen including the first pattern and the second pattern, having a different shape or size to the first pattern, or a first specimen including the first pattern and a second specimen including the second pattern; a step in which a second electron beam observation device generates a second image by scanning a second electron beam across the first and second patterns; and a step in which the first or second electron beam observation device calculates a correction factor at a peak frequency extracted selectively from first and second frequency characteristics calculated on the basis of the first and second images.

Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device

Provided is an electron beam observation device that includes: an electron source; an objective lens concentrating an electron beam emitted from the electron source; and a control unit configured to perform control such that a plurality of images is generated by capturing images of a reference sample having a specific pattern, and a frequency characteristic is calculated for each of the plurality of images, in which an image is generated based on a secondary signal generated from a sample due to irradiation of the sample with the electron beam, and the control unit holds the plurality of frequency characteristics.

Electron beam observation device, electron beam observation system, and control method of electron beam observation device

An electron beam device suitable for observing the bottom of a deep groove or hole with a high degree of accuracy under a large current condition includes: an electron optical system having an irradiation optical system to irradiate a first aperture with an electron beam emitted from an electron source and a reduction projection optical system to project and form an aperture image of the first aperture on a sample, detectors to detect secondary electrons emitted by irradiating the sample with the electron beam through the electron optical system. An image processing unit generates a two-dimensional image from detection signals obtained by irradiating the sample while the electron beam scans the sample two-dimensionally by scanning deflectors of the electron optical system. Further, generates a reconstructed image by deconvoluting electron beam intensity distribution information of an ideal aperture image of the first aperture from the generated two-dimensional image information.

Electron beam device and sample inspection method

To reduce the risk of measurement accuracy degradation and information lost due to adhesion of contamination that occurs by irradiation with charged particle beam. The charged particle beam device includes: a deflector for scanning a charged particle beam; a detector for detecting secondary charged particles generated by the interaction of the charged particle beam with a sample; and a system control unit including a calculation part, a measurement part, and a storage part. The measurement part measures a feature amount from an image formed based on a signal output from the detector after a charged particle beam is scanned on the sample by the deflector (S). The calculation part calculates an amount of contamination adhering to a surface of the sample by irradiation of the sample with the charged particle beam, from a change in the feature amount measured by the measurement part (S). Then, the storage part adds the information of the contamination amount to the image and stores the image information (S).

Charged particle beam device

A high-frequency treatment instrumentcomprises a flexible tubewhich is inserted into a body cavity and a treatment portionwhich is located on the distal end of the flexible tubewhen a high-frequency current is applied. In this high frequency treatment instrument, the flexible tubeis formed by a plurality of wound conductive wires and is provided with a multiple-thread coilconnected electrically to the treatment portion, and the high-frequency current is applied to the multiple-thread coil

High-frequency treatment instrument

An endoscope treatment tool includes a sheath having electric insulation; and an electrode unit provided at a distal end portion of the sheath. The electrode unit includes a rod-shaped electrode that is provided to extend in an axis direction of the sheath and is capable of being arranged in a state where the electrode protrudes from the distal end portion of the sheath and is exposed to the outside; and a chip that is fixed in a state where a distal end portion of the electrode is inserted into a concave portion provided in a proximal end surface so as to extend in the axis direction, has a greater external diameter than the external diameter of the electrode, and is formed from a single electric insulation material. The concave portion is formed with a smaller-diameter portion that allows the distal end portion of the electrode to be inserted thereinto.

Endoscope treatment tool

A treatment tool for endo scope includes a pair of forceps members (first forceps members and second forceps member) supported by a forceps rotation axis such that they can rotate relatively, an operation part for performing an open-close operation of the pair of forceps members, an operation wire that connects the pair of forceps members and the operation part, an insertion part which the operation wire is inserted into, a cover member that secures the forceps rotation axis to the insertion part, a connection member including a link rotation axis, provided at a distal-end part of the operation wire, and a pair of link members (first link member and second link member), first end parts of each being rotatably connected via respective rotation axis members to a proximal-end part of each of the pair of forceps members, and second end parts of each being rotatably connected to the link rotation member. The cover member includes grooves formed such that, by engaging with end parts of the rotation axis members, they restrict the movement of the rotation axis members in a direction of approaching the axis of the operation wire.

Treatment tool for endoscope

A high-frequency treatment instrument of the present invention includes: a pair of forceps members that includes a conductive electrode portion and an insulating portion and is supported by the forceps rotation shaft so as to be relatively rotatable; an operation section configured to open and close the pair of forceps members; a link mechanism that is attached to the pair of forceps members and includes a pair of link members; an operation wire that connects the link mechanism to the operation section; a rotation contact member that is rotatably connected to the pair of forceps members; and a regulation wire in which one end thereof is electrically connected to the rotation contact member, a part of an intermediate portion thereof is disposed so as to pass through a space between the respective link members, and the other end thereof is electrically connected to a power supply.

A treatment instrument for endoscope includes a first and a second forceps members having a conductive electrode part; a forceps rotation axis that supports the forceps members so that they can rotate relative to each other, a first and a second link members being connected via a rotation axis to the forceps members respectively, and make the forceps members open and close, a link support member supporting the forceps members in a state where they are separated at a predetermined interval when they are opened and closed, an operation part connecting to the link support member, and opens and closes the forceps members by moving the link members, and a power supply wire, one end thereof being connected to the electrode part by being attached to the forceps rotation axis, and another end thereof being connected to a current supply means providing a current to the electrode part.

Treatment instrument for endoscope

Provided is an endoscope treatment tool including: a pair of clamp members that is supported by a clamp rotary shaft to be relatively rotatable; an operation section that is used to open and close the pair of clamp members; an operation wire that connects the pair of clamp members to the operation section; a connection member that is provided at the front end of the operation wire and includes at least one link rotary shaft; a pair of link members of which a first end is rotatably connected to each end of the pair of clamp members and a second end is rotatably connected to the link rotary shaft; and a regulation portion that regulates the connection member and the operation wire in a relative movement direction with respect to the clamp rotary shaft, wherein the connection member includes a groove formed to be parallel to the axis of the operation wire, and wherein the regulation portion engages with the groove to regulate the connection member and the operation wire in the relative movement direction.

Endoscopic treatment tool

An endoscopic instrument according to the present invention includes: a wire disposed in a flexible sheath and capable of freely projecting relative to the flexible sheath, the distal end of the wire expanding in radius to form a loop section or a basket section upon being projected from the sheath; and a fixture cylinder for fixing the inserted proximal end of the wire, wherein the fixture cylinder is provided with a wire-radius-increasing-direction-regulating section for regulating the direction in which the radius of the wire increases; and a wire-fixing section, disposed in the vicinity of the proximal end relative to the wire-radius-increasing-direction-regulating section, for fixing the wire.

Endoscopic instrument and method for manufacturing

Method for manufacturing an endoscopic instrument

A treatment tool for an endoscope which grasps an object of treatment, includes: a flexible sheath; a forward-and-backward moving section; and elastic grippers, wherein each of the pair of arms includes: a connector; a bent portion; a rectilinear portion; and a distal clasp, wherein in conjunction with the forward and backward movement operation of the forward-and-backward moving section, the distal ends of the pair of arms are deployed when the pair of arms are projected from the distal end of the sheath, the distal ends of the pair of arms are closed by elastic deformation when the pair of arms are moved into the sheath.

An endoscopic treatment tool is provided which includes: a grasping portion that has a first shoulder portion and second shoulder portion; a current-carrying portion that protrudes out from a distal end of each of the first and second shoulder portions; a pivot portion that is disposed in the distal end of the first shoulder portion so as to protrude in substantially the same direction as the longitudinal direction of the first shoulder portion, the distal end of the pivot portion being provided with an insulating portion; a wire that is connected to the grasping portion; a sheath which has a tubular shape, and into which the wire and grasping portion are inserted; a main body to which the sheath is fixed; and a sliding portion which is disposed to move in the longitudinal direction of the main body in a sliding manner, and to which the wire is connected.

Growing community of inventors

Tokyo, Japan

Megumi Kimura