Eindhoven, Netherlands

Maurice Peemen

USPTO Granted Patents = 14 

 

Average Co-Inventor Count = 3.3

ph-index = 1

Forward Citations = 5(Granted Patents)


Location History:

  • Rijsbergen, NL (2021 - 2023)
  • Eindhoven, NL (2022 - 2024)

Company Filing History:


Years Active: 2021-2025

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14 patents (USPTO):Explore Patents

Title: Maurice Peemen: Innovator in Tomographic Imaging

Introduction

Maurice Peemen is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of imaging technology, holding a total of 14 patents. His work primarily focuses on advancements in tomographic imaging and charged particle microscopy.

Latest Patents

One of Peemen's latest patents is titled "Sparse image reconstruction from neighboring tomography tilt images." This innovation involves processing a tilt series of 2D images by aligning and combining images within a group of neighboring images. The tilt series typically includes sparsely sampled images, and the method allows for the selection of reference frames from these images to produce replacement frames for tomographic reconstruction.

Another recent patent is "Area selection in charged particle microscope imaging." This patent discloses various apparatuses, systems, methods, and computer-readable media related to area selection in charged particle microscope imaging. The invention includes logic for generating data sets associated with a specimen area and determining whether additional imaging rounds are necessary based on predicted parameters.

Career Highlights

Maurice Peemen is currently employed at FEI Company, where he continues to develop innovative imaging solutions. His work has significantly impacted the field, enhancing the capabilities of imaging technologies used in various applications.

Collaborations

Peemen collaborates with talented individuals such as Pavel Potocek and Remco Schoenmakers, contributing to a dynamic and innovative work environment.

Conclusion

Maurice Peemen's contributions to imaging technology through his patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in tomographic imaging and charged particle microscopy.

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