The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Nov. 30, 2023
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Remco Schoenmakers, Eindhoven, NL;

Maurice Peemen, Eindhoven, NL;

Pavel Potoček, Eindhoven, NL;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 20/69 (2022.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06V 20/693 (2022.01); H01J 37/28 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/20084 (2013.01);
Abstract

The invention relates to a method implemented by a data processing apparatus, comprising the steps of receiving an image; providing a set-point for a desired image quality parameter of said image; and processing said image using an image analysis technique for determining a current image quality parameter of said image. In the method, the current image quality parameter is compared with said desired set-point. Based on said comparison, a modified image is generated by using an image modification technique. The generating comprises a step of deteriorating said image in terms of said image quality parameter in case said current image quality parameter exceeds said set-point. The modified image is then output and may be further analysed.


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