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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12288667 B1

PDFFull Text
Date of Patent:
Apr. 29, 2025

Filed:

Jun. 02, 2022

Live-assisted image acquisition method and system with charged particle microscopy

Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Pavel Potocek, Eindhoven, NL;

Bert Henning Freitag, Brueggen, DE;

Maurice Peemen, Rijsbergen, NL;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:

Klarquist Sparkman, LLP

Primary Examiner:

David E Smith

Assistant Examiner:

Hsien C Tsai

Int. Cl.
CPC ...
H01J 37/28 (2005.12); G06T 7/00 (2016.12); H01J 37/20 (2005.12); H01J 37/22 (2005.12); H01J 37/244 (2005.12); H01J 37/26 (2005.12);
U.S. Cl.
CPC ...
H01J 37/28 (2012.12); G06T 7/0004 (2012.12); H01J 37/20 (2012.12); H01J 37/222 (2012.12); H01J 37/244 (2012.12); H01J 37/265 (2012.12); G06T 2207/10061 (2012.12); G06T 2207/20081 (2012.12); H01J 2237/226 (2012.12);
Abstract

A method of imaging a sample includes acquiring one or more first images of a region of the sample at a first imaging condition with a charged particle microscope system. The one or more first images are applied to an input of a trained machine learning model to obtain a predicted image indicating atom structure probability in the region of the sample. An enhanced image indicating atom locations in the region of the sample based on the atom structure probability in the predicted image is caused to be displayed in response to obtaining the predicted image.

Find Patent Forward Citations

Potocek, Pavel. (2025). Live-assisted image acquisition method and system with charged particle microscopy (U.S. Patent No. 12288667). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12288667

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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