This inventor holds 5 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 1996-2010.
Location History:
- Ashikaga, JP (1996 - 2000)
- Tokyo, JP (2008)
- Tochigi, JP (2010)
Company Filing History:
Years Active: 1996-2010
Title: Masuhiro Yamada: Innovator in Testing Apparatus Technology
Introduction
Masuhiro Yamada is a prominent inventor based in Ashikaga, Japan. He has made significant contributions to the field of testing apparatus technology, holding a total of 5 patents. His work focuses on developing advanced testing solutions that enhance the reliability and efficiency of electronic devices.
Latest Patents
Yamada's latest patents include a "Test Apparatus and Test Module" and a "Testing Apparatus and Testing Method." The test apparatus is designed to evaluate a device under test, featuring a control apparatus, a pattern generator, variable delay circuits, and micro-controllers that work in parallel to measure and store delay amounts. The testing apparatus includes a pattern generator that produces address and data signals for multiple memories under test, along with logic comparators and memory controllers that identify and manage bad addresses in the memory.
Career Highlights
Masuhiro Yamada is currently employed at Advantest Corporation, where he continues to innovate in the field of testing technology. His work has been instrumental in advancing the capabilities of testing apparatus, making them more effective in identifying issues in electronic devices.
Collaborations
Yamada collaborates with notable colleagues such as Yokichi Hayashi and Hiroshi Tsukahara. Their combined expertise contributes to the development of cutting-edge testing solutions.
Conclusion
Masuhiro Yamada's contributions to testing apparatus technology have established him as a key figure in the field. His innovative patents and collaborative efforts continue to drive advancements in electronic testing solutions.