The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Nov. 24, 2008
Junichi Matsumoto, Saitama, JP;
Masuhiro Yamada, Tochigi, JP;
Junichi Matsumoto, Saitama, JP;
Masuhiro Yamada, Tochigi, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, comprising a control apparatus that controls the test apparatus; a pattern generator that generates a plurality of test patterns to be provided to a plurality of input terminals of the device under test; a plurality of variable delay circuits that designate a timing for supplying each of the plurality of test patterns to a corresponding input terminal of the plurality of input terminals; and a plurality of micro-controllers that operate in parallel, according to instructions from the control apparatus, to each measure a delay amount of a variable delay circuit when the variable delay circuit is set with a prescribed delay setting value and store the delay setting value in association with the measured delay amount.