Nirasaki, Japan

Masataka Hatta



Average Co-Inventor Count = 1.6

ph-index = 4

Forward Citations = 443(Granted Patents)


Location History:

  • Yamanashi-ken, JP (2000)
  • Nirasaki, JP (2005 - 2017)
  • Yamanashi, JP (1992 - 2018)

Company Filing History:


Years Active: 1992-2018

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13 patents (USPTO):Explore Patents

Title: Masataka Hatta: Innovative Mind Behind Advanced Testing Technologies

Introduction

Masataka Hatta, an accomplished inventor from Nirasaki, Japan, has made significant contributions in the field of semiconductor testing technologies. With a remarkable portfolio of 13 patents, Hatta’s innovations demonstrate his expertise and dedication to improving device testing methods and equipment.

Latest Patents

Among Hatta's latest patents, the "Device Test Method" stands out. This innovative method involves a substrate test apparatus equipped with a movable mounting table and a probe card designed to engage with a measuring electrode. This design allows for precise measurements of electrical characteristics while maintaining stability during the testing process. Another noteworthy patent is the "Probe Device," tailored for performing electrical tests on semiconductor devices. This device features a sophisticated mounting table for semiconductor wafers and includes mechanisms to control temperature, ensuring optimal testing conditions.

Career Highlights

Hatta has developed his expertise through significant roles at prominent companies such as Tokyo Electron Limited and Sanyo Electric Co., Ltd. His work at these organizations has not only shaped his career but also contributed to advancements in the semiconductor industry.

Collaborations

Throughout his career, Hatta has collaborated with notable colleagues, including Eiji Miyata and Masahiko Sugiyama. These partnerships have fostered an environment of innovation, enabling the development of cutting-edge technologies that have benefitted the semiconductor testing arena.

Conclusion

Masataka Hatta's contributions to the field of semiconductor testing are invaluable. Through his innovative patents and collaborations, he has greatly influenced the efficiency and effectiveness of electrical testing methods. His ongoing commitment to innovation marks him as a key figure in the technological landscape of Japan and beyond.

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