Masaru Takakura

Title: Masaru Takakura: Innovator in Surface Analysis Technology

Introduction

Masaru Takakura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of surface analysis technology, holding a total of 4 patents. His work focuses on advanced analytical methods that enhance the understanding of material properties.

Latest Patents

Takakura's latest patents include a scatter diagram display device and a surface analyzer. The scatter diagram display device features a principal component analysis section that performs analysis on intensity or concentration map data. It includes a priority level setting section that assigns priority levels to each element based on the analysis results. Additionally, a display control section arranges and displays multiple scatter diagrams generated from the prioritized elements. The surface analyzer patent encompasses a principal component analysis section that calculates principal component scores from elemental map data. It also includes a scatter diagram generation section, a peak position detection section, and a clustering section that classifies points within the scatter diagram into groups based on their distances to peak positions.

Career Highlights

Masaru Takakura is currently employed at Jeol Ltd., a company renowned for its innovative scientific instruments and analytical solutions. His work at Jeol Ltd. has positioned him as a key player in the development of advanced surface analysis technologies.

Collaborations

Throughout his career, Takakura has collaborated with notable colleagues, including Norihisa Mori and Shinya Fujita. These collaborations have contributed to the advancement of research and development in their respective fields.

Conclusion

Masaru Takakura's contributions to surface analysis technology through his patents and work at Jeol Ltd. highlight his role as an influential inventor. His innovative approaches continue to shape the landscape of material analysis and understanding.