Location History:
- Geldrop, NL (2014 - 2016)
- Eindhoven, NL (2021)
Company Filing History:
Years Active: 2014-2021
Title: Martin Verheijen: Innovator in Electron Microscopy
Introduction
Martin Verheijen, an accomplished inventor based in Geldrop, NL, has made significant contributions to the field of electron microscopy. With three patents to his name, Verheijen has demonstrated his innovative spirit and technical prowess. His work is particularly focused on advancing imaging techniques and calibration methods for advanced microscopy systems.
Latest Patents
Verheijen's latest patents include two notable inventions:
1. **Method of Imaging a Sample Using an Electron Microscope** - This invention outlines a method to enhance the imaging of samples mounted on a sample holder within an electron microscope. It involves generating a beam of energetic electrons and utilizing optical elements to concentrate and direct this beam toward the sample. The technique includes acquiring a tilt series of images by adjusting the position and tilt of the sample during image acquisition, providing a unique perspective at various angles.
2. **Method of Calibrating a Scanning Transmission Charged-Particle Microscope** - This patent details a method for calibrating a Scanning Transmission Charged-Particle Microscope, ensuring accurate and reliable imaging capabilities essential for research and industry applications.
Career Highlights
Martin Verheijen is currently employed at FEI Company, where he continues to push the boundaries of electron microscopy technologies. His work is vital in improving the capabilities of microscopy tools, making them indispensable for scientific research and technical applications.
Collaborations
Throughout his career, Verheijen has collaborated with talented professionals such as Erik Michiel Franken and Remco Schoenmakers. These partnerships have fostered an environment of innovation and creativity, leading to the successful development of groundbreaking technologies in the field.
Conclusion
In summary, Martin Verheijen stands out as a respected inventor in the world of electron microscopy. His patents, particularly in imaging techniques and calibration methods, highlight his commitment to advancing scientific knowledge and technology. With his extensive collaboration and dedication to innovation, Verheijen continues to make a lasting impact in the field of microscopy.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.