Company Filing History:
Years Active: 2009-2024
Title: Martin Keim: Innovator in Memory Built-in Self-Test Systems
Introduction
Martin Keim is a notable inventor based in Sherwood, OR (US), recognized for his contributions to memory built-in self-test systems. With a total of 8 patents, he has made significant advancements in the field of memory technology.
Latest Patents
One of his latest patents is titled "Memory built-in self-test with automated reference trim feedback for memory sensing." This application discloses a memory built-in self-test system designed to prompt a memory device to sense values of stored data using a reference trim during memory read operations. The system can automatically set the reference trim for the memory device, including a controller that prompts the memory device to perform read operations with various test values. Additionally, it features a trim feedback circuit that determines when the memory device fails to correctly sense stored data and adjusts the reference trim accordingly.
Another significant patent is "Memory built-in self-test with automated multiple step reference trimming." This invention allows a memory device to sense stored data during read operations using a reference trim. The system performs a multiple-step process to set the reference trim, establishing a range of available reference trim values and selecting one based on the performance of the memory device during read operations.
Career Highlights
Throughout his career, Martin Keim has worked with prominent companies such as Mentor Graphics Corporation and Siemens Industry Software GmbH. His experience in these organizations has contributed to his expertise in memory technology and innovation.
Collaborations
Some of his notable coworkers include Etienne Racine and Ronald Press, who have collaborated with him on various projects.
Conclusion
Martin Keim's innovative work in memory built-in self-test systems has significantly impacted the field of memory technology. His patents reflect a commitment to enhancing the reliability and efficiency of memory devices.