The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Sep. 09, 2013
Applicant:
Mentor Graphics Corporation, Wilsonville, OR (US);
Inventors:
Ronald Press, West Linn, OR (US);
Etienne Racine, Blainville, CA;
Martin Keim, Sherwood, OR (US);
Jean-Francois Cote, Quebec, CA;
Assignee:
Mentor Graphics Corporation, Wilsonville, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01); G01R 31/3187 (2006.01); G06F 11/27 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G01R 31/3177 (2013.01); G01R 31/3185 (2013.01); G01R 31/318371 (2013.01); G01R 31/318547 (2013.01); G01R 31/3187 (2013.01); G01R 31/318533 (2013.01); G01R 31/318536 (2013.01); G06F 11/27 (2013.01);
Abstract
Aspects of the invention relate to test access architecture for stacked dies. The disclosed test access interface for a die can function as a stand-alone test access interface, allowing both pre-bond testing and post-bond testing of the die. In a stack of dies, the test access interface of a die may be enabled/disabled by the test access interface of an adjacent die.