Markus B Raschke

Title: Innovations of Markus B Raschke in Nanoimaging Technologies

Introduction

Markus B Raschke, based in Boulder, Colorado, is a prominent inventor known for his contributions to the field of nanoimaging and spectroscopy. With a remarkable portfolio of six patents, his innovative work continues to shape the way we understand material properties at the nanoscale.

Latest Patents

Raschke's latest patents include revolutionary methods and systems for scanning probe sample property measurement and imaging. One notable invention is the development of infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM). This advanced technique enables powerful nanoimaging and spectroscopy, with applications spanning biological sciences to quantum materials. Raschke has addressed challenges regarding long measurement times and signal drift by introducing a novel computational approach that transforms the basis from a stationary to a rotating frame of the IR carrier frequency. This innovation can accelerate IR s-SNOM data collection by factors of ten or more, enhancing the efficiency of probing electronic or vibrational resonances.

Another significant patent is his method and apparatus for physical property measurement using a probe-based nano-localized light source. This invention employs a nano-confined light source within a scanning probe microscopy (SPM) framework, allowing for precise excision of the sample on a nanoscale level. The design ensures that the separation between the probe tip apex and the sample remains under 10 nm, utilizing an AFM TR Mode control scheme to maintain accuracy during spectroscopic measurements.

Career Highlights

Throughout his career, Raschke has worked at leading companies such as Anasys Instruments Corporation and Bruker Nano GmbH, where he has been integral to advancing technologies in nanoimaging and analysis. His research has significantly impacted both practical applications and theoretical understandings in nanotechnology.

Collaborations

Markus B Raschke has collaborated with notable figures in the field, including Craig Prater and Stefan B Kaemmer. These partnerships have fostered a rich exchange of ideas and methodologies, further enhancing the innovations brought forth by Raschke.

Conclusion

Markus B Raschke's work exemplifies the power of innovation in the realm of nanoimaging and spectroscopy. His patents not only highlight his creativity and technical expertise but also pave the way for future advancements in material characterization and analysis at the nanoscale. As he continues to explore new frontiers, the scientific community eagerly anticipates his future contributions.