The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Nov. 30, 2011
Mikhail Belkin, Austin, TX (US);
Feng LU, Austin, TX (US);
Vladislav V. Yakolev, College Station, TX (US);
Craig Prater, Santa Barbara, CA (US);
Kevin Kjoller, Santa Barbara, CA (US);
Markus Raschke, Boulder, CO (US);
Mikhail Belkin, Austin, TX (US);
Feng Lu, Austin, TX (US);
Vladislav V. Yakolev, College Station, TX (US);
Craig Prater, Santa Barbara, CA (US);
Kevin Kjoller, Santa Barbara, CA (US);
Markus Raschke, Boulder, CO (US);
Anasys Instruments Corp., Santa Barbara, CA (US);
Abstract
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface by using the AFM probe to detect wavelength dependent IR radiation interaction, typically absorption with the sample in the region of the tip. The tip may be configured to produce electric field enhancement when illuminated by a radiation source. This enhancement allows for significantly reduced illumination power levels resulting in improved spatial resolution by confining the sample-radiation interaction to the region of field enhancement which is highly localized to the tip.