Austin, TX, United States of America

Feng Lu


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: **Feng Lu: Innovator in High Frequency Deflection Measurement**

Introduction

Feng Lu is a prominent inventor based in Austin, TX, who has made notable contributions in the field of spectroscopy through his innovative techniques. With a singular patent to his name, Lu's work focuses on improving the capabilities of infrared (IR) absorption measurements, showcasing his expertise in advanced research methodologies.

Latest Patents

Feng Lu holds a patent titled "High Frequency Deflection Measurement of IR Absorption." This patent introduces an atomic force microscopy (AFM) based technique that enables highly localized IR spectroscopy on sample surfaces. Utilizing an AFM probe, this method detects wavelength-dependent interactions of IR radiation, typically involving absorption with samples located in the region of the probe's tip. An essential feature of this invention is the ability of the tip to produce electric field enhancement when illuminated, resulting in significantly reduced illumination power levels. This enhancement improves spatial resolution by confining sample-radiation interactions to a highly localized area around the tip.

Career Highlights

Feng Lu is associated with Anasys Instruments Corporation, where he has implemented his innovative approaches to enhance the company's technological capabilities. His career has been characterized by a commitment to developing practical solutions that integrate advanced scientific principles into applicable technologies.

Collaborations

Throughout his career, Feng Lu has collaborated with notable colleagues, including Mikhail A Belkin and Vladislav V Yakolev. These partnerships highlight the importance of teamwork in advancing scientific discovery and the development of new technologies in the realm of measurement and analysis.

Conclusion

In conclusion, Feng Lu stands out in the field of spectroscopy with his pioneering work in high frequency deflection measurement techniques. His inventive spirit and dedication to research not only contribute to the advancements in IR spectroscopy but also pave the way for future innovations in the industry. As he continues his journey with Anasys Instruments Corporation, his contributions are expected to have lasting impacts in the scientific community.

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