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Santa Barbara, CA, United States of America

Anasys Instruments Corporation

USPTO Granted Patents = 18

% Expired Patents = 22.2

Trademarks = 1

Forward Citations = 295

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23 inventors (with patents filed for the assignee):

Craig Prater (14 out of 60 patents)

Kevin Kjoller (12 out of 33 patents)

Michael Reading (5 out of 5 patents)

4. William P King (3 out of 29 patents)

5. Sam Berweger (3 out of 4 patents)

6. Markus B Raschke (3 out of 6 patents)

7. Doug Gotthard (3 out of 9 patents)

8. Honghua Yang (2 out of 6 patents)

9. Konstantin L Vodopyanov (2 out of 13 patents)

10. Alexandre Dazzi (2 out of 2 patents)

11. Rui Prazeres (2 out of 2 patents)

12. A Dazzi Dazzi (2 out of 2 patents)

13. Clotilde Policar (2 out of 2 patents)

14. Anthony Kurtz (2 out of 2 patents)

15. Mikhail A Belkin (1 out of 10 patents)

18 patents: Sort by Forward Citations

1. 9778282 - Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy (2017-10-03),

2. 9658247 - Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy (2017-05-23),

3. 9372154 - Method and apparatus for infrared scattering scanning near-field optical microscopy (2016-06-21),

4. 9046492 - Stimulated raman nanospectroscopy (2015-06-02),

5. 8914911 - Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy (2014-12-16),

6. 8869602 - High frequency deflection measurement of IR absorption (2014-10-28),

7. 8793811 - Method and apparatus for infrared scattering scanning near-field optical microscopy (2014-07-29),

8. 8680467 - High frequency deflection measurement of IR absorption with a modulated IR source (2014-03-25),

9. 8646319 - Dynamic power control for nanoscale spectroscopy (2014-02-11),

10. 8607622 - High frequency deflection measurement of IR absorption (2013-12-17),

11. 8418538 - High frequency deflection measurement of IR absorption (2013-04-16),

12. 8402819 - High frequency deflection measurement of IR absorption (2013-03-26),

13. 8387443 - Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer (2013-03-05),

14. 8242448 - Dynamic power control, beam alignment and focus for nanoscale spectroscopy (2012-08-14),

15. 8177422 - Transition temperature microscopy (2012-05-15),

Company Overview

Anasys Instruments Corporation, based in Santa Barbara, California, specializes in advanced instrumentation for nanoscale characterization and analysis. The company focuses on developing innovative solutions that enhance the capabilities of atomic force microscopy (AFM) and other related technologies. Their products are widely utilized in research and development across various fields, including materials science, nanotechnology, and life sciences, enabling scientists and engineers to gain deeper insights into material properties and behaviors at the nanoscale.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

18 Patents

#27 in Santa Barbara, CA

#4,284 in California

#17,952 in US

#34,187 in the World

Santa Barbara, CA, United States of America

Anasys Instruments Corporation

Forward Citations = 295

23 inventors:

Craig Prater (14 out of 60 patents)

Kevin Kjoller (12 out of 33 patents)

Michael Reading (5 out of 5 patents)

4. William P King (3 out of 29 patents)

5. Sam Berweger (3 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Anasys Instruments Corporation. Retrieved from https://idiyas.com/company/anasys-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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