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Santa Barbara, CA, United States of America

Anasys Instruments Corporation

USPTO Granted Patents = 18

Trademarks = 1

Forward Citations = 283

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23 inventors (with patents filed for the assignee):

Craig Prater (14 out of 60 patents)

Kevin Kjoller (12 out of 33 patents)

Michael Reading (5 out of 5 patents)

4. William P King (3 out of 28 patents)

5. Sam Berweger (3 out of 4 patents)

6. Markus B Raschke (3 out of 6 patents)

7. Doug Gotthard (3 out of 9 patents)

8. Honghua Yang (2 out of 6 patents)

9. Konstantin L Vodopyanov (2 out of 13 patents)

10. Alexandre Dazzi (2 out of 2 patents)

11. Rui Prazeres (2 out of 2 patents)

12. A Dazzi Dazzi (2 out of 2 patents)

13. Clotilde Policar (2 out of 2 patents)

14. Anthony Kurtz (2 out of 2 patents)

15. Mikhail A Belkin (1 out of 10 patents)

18 patents: Sort by Forward Citations

1. 9778282 - Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy (2017-10-03),

2. 9658247 - Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy (2017-05-23),

3. 9372154 - Method and apparatus for infrared scattering scanning near-field optical microscopy (2016-06-21),

4. 9046492 - Stimulated raman nanospectroscopy (2015-06-02),

5. 8914911 - Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy (2014-12-16),

6. 8869602 - High frequency deflection measurement of IR absorption (2014-10-28),

7. 8793811 - Method and apparatus for infrared scattering scanning near-field optical microscopy (2014-07-29),

8. 8680467 - High frequency deflection measurement of IR absorption with a modulated IR source (2014-03-25),

9. 8646319 - Dynamic power control for nanoscale spectroscopy (2014-02-11),

10. 8607622 - High frequency deflection measurement of IR absorption (2013-12-17),

11. 8418538 - High frequency deflection measurement of IR absorption (2013-04-16),

12. 8402819 - High frequency deflection measurement of IR absorption (2013-03-26),

13. 8387443 - Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer (2013-03-05),

14. 8242448 - Dynamic power control, beam alignment and focus for nanoscale spectroscopy (2012-08-14),

15. 8177422 - Transition temperature microscopy (2012-05-15),

Anasys Instruments Corporation is a leading provider of advanced nanoscale analysis tools. The company specializes in the development and manufacturing of atomic force microscopy (AFM) instruments, as well as other innovative nanoscale measurement techniques. Through their cutting-edge technologies, Anasys Instruments assists researchers and scientists in various industries worldwide to gain valuable insights into materials' properties at the atomic and molecular levels. With a strong commitment to customer satisfaction and scientific advancement, Anasys Instruments continues to drive innovation in nanoscale analysis.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

18 Patents

#16 in Santa Barbara, CA

#4,146 in California

#17,374 in US

#33,132 in the World

Santa Barbara, CA, United States of America

Anasys Instruments Corporation

Forward Citations = 283

23 inventors:

Craig Prater (14 out of 60 patents)

Kevin Kjoller (12 out of 33 patents)

Michael Reading (5 out of 5 patents)

4. William P King (3 out of 28 patents)

5. Sam Berweger (3 out of 4 patents)

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