The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Aug. 15, 2008
Applicants:

Kevin Kjoller, Santa Barbara, CA (US);

Khoren Sahagian, Burbank, CA (US);

Doug Gotthard, Carpinteria, CA (US);

Anthony Kurtz, Sanat Barbara, CA (US);

Craig Prater, Santa Barbara, CA (US);

Roshan Shetty, Westlake Village, CA (US);

Michael Reading, Norwich, GB;

Inventors:

Kevin Kjoller, Santa Barbara, CA (US);

Khoren Sahagian, Burbank, CA (US);

Doug Gotthard, Carpinteria, CA (US);

Anthony Kurtz, Sanat Barbara, CA (US);

Craig Prater, Santa Barbara, CA (US);

Roshan Shetty, Westlake Village, CA (US);

Michael Reading, Norwich, GB;

Assignee:

Anasys Instruments, Santa Barbara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/00 (2006.01); G01K 3/00 (2006.01); G01K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.


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Kjoller, Kevin. (2012). Transition temperature microscopy (U.S. Patent No. 8177422). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8177422

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