The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Nov. 04, 2011
A. Dazzi Dazzi, Les Ulis, FR;
Clotilde Policar, Paris, FR;
Kevin Kjoller, Santa Barbara, CA (US);
Michael Reading, Norwich, GB;
Konstantin Vodopyanov, San Jose, CA (US);
Craig Prater, Santa Barbara, CA (US);
A. Dazzi Dazzi, Les Ulis, FR;
Clotilde Policar, Paris, FR;
Kevin Kjoller, Santa Barbara, CA (US);
Michael Reading, Norwich, GB;
Konstantin Vodopyanov, San Jose, CA (US);
Craig Prater, Santa Barbara, CA (US);
Anasys Instruments Inc., Santa Barbara, CA (US);
Abstract
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.