Avon, NY, United States of America

Mariusz Oldziej

This inventor holds 7 USPTO granted patents and 3 published patent applications and 1 EPO patent. Top assignees: Mks Instruments, Inc., Lam Research Corporation. Active years: 2019-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mariusz Oldziej. Retrieved from https://idiyas.com/inventor/mariusz-oldziej

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7 

% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 3

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2019-2024

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7 patents (USPTO):Explore Patents

Title: Mariusz Oldziej: Innovator in Radio Frequency Technology

Introduction

Mariusz Oldziej is a notable inventor based in Avon, NY, who has made significant contributions to the field of radio frequency (RF) technology. With a total of seven patents to his name, Oldziej has developed innovative solutions that address various challenges in RF power generation and control.

Latest Patents

Among his latest patents is the "Apparatus and tuning method for mitigating RF load impedance variations due to periodic disturbances." This invention describes a radio frequency power generation system that includes an RF power source generating an RF output signal delivered to a load. The RF power controller is designed to generate a control signal to vary the RF output signal, adjusting parameters based on a cost function influenced by perturbations in an actuator. Another significant patent is the "Pulse and bias synchronization methods and systems," which details a radio frequency generator that outputs an RF power signal. This system includes a controller that modulates the RF power signal and synchronizes state transitions of pulses with the characteristics of another RF generator.

Career Highlights

Mariusz Oldziej has worked with prominent companies in the technology sector, including MKS Instruments, Inc. and Lam Research Corporation. His experience in these organizations has allowed him to refine his expertise in RF technology and contribute to various innovative projects.

Collaborations

Throughout his career, Oldziej has collaborated with talented

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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