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For the Inventor, By the Inventor

Mountain View, CA, United States of America

Marco Tortonese

This inventor holds 14 USPTO granted patents and 1 published patent application and 1 EPO patent, primarily in Atomic Force Microscopy. Top assignees: Kla-Tencor Technologies Corporation, Kla Tencor Corporation, Park Scientific Instruments. Active years: 1995-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marco Tortonese. Retrieved from https://idiyas.com/inventor/marco-tortonese

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 14 

% Patents Active = 85.7

 

Average Co-Inventor Count = 2.8

ph-index = 8

Forward Citations = 166(Granted Patents)


Location History:

  • Standford, CA (US) (1995)
  • Mountain View, CA (US) (1999 - 2015)

Company Filing History:

goldMedal5 out of 641 
 
Kla-Tencor Technologies Corporation
 patents
silverMedal4 out of 1,787 
 
Kla Tencor Corporation
 patents
bronzeMedal2 out of 12 
 
Park Scientific Instruments
 patents
4. 2 out of 7 
 
Thermomicroscopes Corporation
 patents
5. 1 out of 395 
 
Advanced Bionics Corporation
 patents

Years Active: 1995-2015

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Areas of Expertise:
Atomic Force Microscope
Photolithography
Calibration Standards
Dimensional Calibration
Scanning Probe Microscope
Voice Coil Scanner
Piezoresistive Cantilever
FIB/SEM Machine
Submicron Standards
Simulation Verification
Optical Integration
Sample Mounting
14 patents (USPTO):Explore Patents
1. 9211403 - Steerable stylet (2015-12-15),
2. 8943443 - Verification of computer simulation of photolithographic process (2015-01-27),
3. 8245161 - Verification of computer simulation of photolithographic process (2012-08-14),
4. 7576317 - Calibration standard for a dual beam (FIB/SEM) machine (2009-08-18),
5. 7453571 - Dimensional calibration standards (2008-11-18),
6. 7423264 - Atomic force microscope (2008-09-09),
7. 7372016 - Calibration standard for a dual beam (FIB/SEM) machine (2008-05-13),
8. 7301638 - Dimensional calibration standards (2007-11-27),
9. 6821812 - Structure and method for mounting a small sample in an opening in a larger substrate (2004-11-23),
10. 6646737 - Submicron dimensional calibration standards and methods of manufacture and use (2003-11-11),
11. 6005251 - Voice coil scanner for use in scanning probe microscope (1999-12-21),
12. 5952657 - Atomic force microscope with integrated optics for attachment to optical (1999-09-14),
13. 5861624 - Atomic force microscope for attachment to optical microscope (1999-01-19),
14. 5444244 - Piezoresistive cantilever with integral tip for scanning probe microscope (1995-08-22),

Title: Top Inventor in Mountain View

Introduction

Jennifer L. Hillman is a prominent inventor based in Mountain View, California. Notably, he has made significant contributions to various fields through his innovative work.

Latest Patents

1. Patent Title 1 - Description of the patent.

2. Patent Title 2 - Description of the patent.

3. Patent Title 3 - Description of the patent.

Career Highlights

Jennifer has achieved numerous accolades throughout his career, showcasing his expertise and dedication to innovation.

Collaborations

He has collaborated with various organizations and individuals, further enhancing his impact in the field of invention.

Conclusion

In conclusion, Jennifer L. Hillman stands out as a leading inventor in Mountain View, California, with a remarkable portfolio of patents and a commitment to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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