Luis Antonio Basto

Title: Luis Antonio Basto: Innovator in Embedded Core Testing

Introduction

Luis Antonio Basto is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of embedded core testing, holding a total of 6 patents. His work focuses on improving the testing processes for embedded systems, which are crucial in modern electronics.

Latest Patents

Among his latest patents is a method and apparatus for testing embedded cores. This innovation addresses the challenge of testing embedded cores when their terminals are not directly accessible. By utilizing a test wrapper that includes boundary scan test (BST) cells, Basto's invention allows for effective testing of these cores. Another significant patent involves testing memory devices, where an apparatus is designed to perform tests on pipelined memory elements. This apparatus can interrupt testing upon detecting a failure and store the address of the faulty memory element for further analysis.

Career Highlights

Luis Antonio Basto has worked with prominent companies in the technology sector, including Analog Devices, Inc. and Advanced Micro Devices Corporation. His experience in these organizations has contributed to his expertise in embedded systems and testing methodologies.

Collaborations

Throughout his career, Basto has collaborated with talented individuals such as Sankaran M Menon and Tien Dinh. These collaborations have likely enriched his work and led to innovative solutions in the field.

Conclusion

Luis Antonio Basto is a distinguished inventor whose work in embedded core testing has made a significant impact on the industry. His patents reflect a commitment to advancing technology and improving testing processes in embedded systems.