The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

Dec. 31, 2002
Applicants:

Sankaran M. Menon, Austin, TX (US);

Luis A. Basto, Austin, TX (US);

Tien Dinh, Cedar Park, TX (US);

Thomas Tomazin, Austin, TX (US);

Juan G. Revilla, Austin, TX (US);

Inventors:

Sankaran M. Menon, Austin, TX (US);

Luis A. Basto, Austin, TX (US);

Tien Dinh, Cedar Park, TX (US);

Thomas Tomazin, Austin, TX (US);

Juan G. Revilla, Austin, TX (US);

Assignee:

Analog Devices, Inc., Norwood, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Testing memory devices. An apparatus may include a test module operative to perform a test on a plurality of pipelined memory elements and a fail trace module operative to interrupt the test in response to identifying a failure of a memory element and to store an address of said memory element in a storage unit.


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