Company Filing History:
Years Active: 1986-1989
Title: The Innovative Contributions of Leslie J Palkuti
Introduction
Leslie J Palkuti is a prominent inventor based in Sunnyvale, CA, known for her significant contributions to the field of integrated circuit reliability testing. With a total of 2 patents, her work has advanced the understanding and methodologies used in the testing of electronic devices.
Latest Patents
Palkuti's latest patents include a "Method for reliability testing of integrated circuits." This innovative method establishes a hardness factor that relates device substrate currents to device lifetimes, which are attributable to interface trap degradation. A beam of ionizing radiation is directed onto the device until a critical dose is reached, at which point the device fails. The critical dose is then plotted against hardness factors, allowing for predictions of device lifetimes.
Another notable patent is the "Method and apparatus for radiation testing of electron devices." This test apparatus is designed for electron devices, such as integrated circuits, at the wafer stage of fabrication. It directs a beam of ionizing radiation through an electrical probe card onto the wafer under test. The probe card and radiation beam share a common port, ensuring that only selected devices are exposed while others remain unaffected. A microscope, supported on a frame, can be interchanged with the radiation beam source, allowing for observation of tested devices.
Career Highlights
Leslie J Palkuti is currently associated with Advanced Research and Applications Corporation, where she continues to innovate and contribute to the field of electronics. Her expertise in reliability testing has made her a valuable asset in the research and development of integrated circuits.
Conclusion
Leslie J Palkuti's work exemplifies the spirit of innovation in the field of electronics. Her patents not only enhance the reliability of integrated circuits but also pave the way for future advancements in technology.