Trademarks = 1

Forward Citations = 719

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3 inventors (with patents filed for the assignee):

Robert A Armistead, Jr (3 out of 5 patents)

Leslie J Palkuti (2 out of 2 patents)

John A Penkethman (1 out of 5 patents)

6 patents: Sort by Forward Citations

1. 5838759 - Single beam photoneutron probe and X-ray imaging system for contraband (1998-11-17),

2. 5638420 - Straddle inspection system (1997-06-10),

3. 4852131 - Computed tomography inspection of electronic devices (1989-07-25),

4. 4816753 - Method for reliability testing of integrated circuits (1989-03-28),

5. 4775220 - Optical system with laser pulse energy control (1988-10-04),

6. 4575676 - Method and apparatus for radiation testing of electron devices (1986-03-11),

Company Overview

Advanced Research and Applications Corporation is a leading technology company specializing in cutting-edge research and development. With a team of highly skilled professionals, the company focuses on developing innovative solutions for various industries including healthcare, defense, and telecommunications. From advanced data analytics to artificial intelligence systems, Advanced Research and Applications Corporation is dedicated to driving technological advancements and delivering top-notch results for its clients.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

6 Patents

#431 in Sunnyvale, CA

#10,570 in California

#44,981 in US

Sunnyvale, CA, United States of America

Advanced Research and Applications Corporation

Forward Citations = 719

3 inventors:

Robert A Armistead, Jr (3 out of 5 patents)

Leslie J Palkuti (2 out of 2 patents)

John A Penkethman (1 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advanced Research and Applications Corporation. Retrieved from https://idiyas.com/company/advanced-research-and-applications

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]