Wuhan, China

Lei Li

USPTO Granted Patents = 6 

Average Co-Inventor Count = 2.3

ph-index = 1


Company Filing History:


Years Active: 2022-2025

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6 patents (USPTO):

Title: Lei Li: Innovator in Semiconductor Technology

Introduction

Lei Li is a prominent inventor based in Wuhan, China, known for his significant contributions to semiconductor technology. With a total of 6 patents, he has made remarkable advancements in methods that enhance the efficiency and performance of semiconductor devices.

Latest Patents

One of Lei Li's latest patents is a method for removing sacrificial layers of a stack of a three-dimensional semiconductor structure in two steps. This innovative method involves forming a stack of alternating insulating layers and sacrificial layers over a substrate, creating a trench to expose the substrate, and systematically removing the sacrificial layers in two distinct areas. Another notable patent is the ladder annealing process for increasing polysilicon grain size in semiconductor devices. This process focuses on enhancing the grain size of polysilicon within memory devices, which is crucial for improving the performance of semiconductor components.

Career Highlights

Throughout his career, Lei Li has worked with leading companies in the semiconductor industry, including Yangtze Memory Technologies Co., Ltd. and Xiamen Tianma Micro-electronics Co., Ltd. His work in these organizations has contributed to the development of cutting-edge technologies that are essential for modern electronics.

Collaborations

Lei Li has collaborated with several talented individuals in the field, including Yuanzhou Zheng and Long Qian. These collaborations have fostered innovation and have led to the successful development of various semiconductor technologies.

Conclusion

In summary, Lei Li is a distinguished inventor whose work in semiconductor technology has led to significant advancements in the field. His innovative patents and collaborations with industry professionals highlight his commitment to enhancing the performance of semiconductor devices.

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