This inventor holds 4 USPTO granted patents. Top assignees: Dupont Photomasks, Inc., Advanced Micro Devices Corporation, E.i. Dupont De Nemours and Company. Active years: 2004-2006.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Laurent Dieu. Retrieved from https://idiyas.com/inventor/laurent-dieu
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 25.0
Average Co-Inventor Count = 2.2
ph-index = 2
Forward Citations = 8(Granted Patents)
Location History:
- Austin, TX (US) (2004 - 2006)
- Round Rock, TX (US) (2006)
Company Filing History:
2 out of 38 Dupont Photomasks, Inc.
1 out of 13,175 
Advanced Micro Devices Corporation
1 out of 16,339 
E.i. Dupont De Nemours and Company
4. 1 out of 2,569
Hoya Corporation
5. 1 out of 17
Toppan Photomasks, Inc.
where one patent can have more than one assignee
Years Active: 2004-2006
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4 patents (USPTO):Explore Patents
I specialize in innovations, inventions, inventors, patent attorneys, assignees, and patents.
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Laurent Dieu. Retrieved from https://idiyas.com/inventor/laurent-dieu
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]