Tokyo, Japan

Kunihiko Chiba

This inventor holds 2 USPTO granted patents. Top assignee: Tokyo Seimitsu Co., Ltd.. Active years: 2016-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kunihiko Chiba. Retrieved from https://idiyas.com/inventor/kunihiko-chiba-lagotsjh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016-2017

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2 patents (USPTO):Explore Patents

Title: Kunihiko Chiba: Innovator in Semiconductor Testing Technology

Introduction

Kunihiko Chiba is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor testing technology. With a total of 2 patents to his name, Chiba's work focuses on enhancing the accuracy and efficiency of probe devices used in semiconductor manufacturing.

Latest Patents

Chiba's latest patents include a "Probe device for testing electrical characteristics of semiconductor element." This innovative device measures the position of every chip in a wafer to acquire actual measurement data. It calculates the variation amount of the actual measurement position of each chip and allows a monitor to display a range-of-variation display image. This image visually represents the variation amount, with a quadrangular area corresponding to each chip and a dot indicating the position shifted from the center based on the variation amount.

Another notable patent is the "Alignment support device and alignment support method for probe device." This invention provides a probe device with an alignment utility function. It allows users to input a condition value for the variation amount of a contact position at which a probe contacts each chip. The device calculates the optimum measurement points to ensure the range of variation is equal to or less than the condition value while minimizing the number of measurement points.

Career Highlights

Kunihiko Chiba is associated with Tokyo Seimitsu Co., Ltd., a company known for its advanced semiconductor testing solutions. His work has significantly impacted the efficiency of semiconductor testing processes, making them more reliable and accurate.

Collaborations

Chiba has collaborated with notable coworkers such as Yuichi Ozawa and Hiroshi Nishimura. Their combined expertise has contributed to the development of innovative technologies in the semiconductor industry.

Conclusion

Kunihiko Chiba's contributions to semiconductor testing technology through his patents demonstrate his commitment to innovation in the field. His work continues to influence the industry, paving the way for advancements in semiconductor manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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