The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Aug. 24, 2015
Tokyo Seimitsu Co., Ltd., Hachioji-Shi, Tokyo, JP;
Yuichi Ozawa, Tokyo, JP;
Hiroshi Nishimura, Tokyo, JP;
Seiichi Ohta, Tokyo, JP;
Yasuhito Iguchi, Tokyo, JP;
Kunihiko Chiba, Tokyo, JP;
Ken Kato, Tokyo, JP;
Tokyo Seimitsu Co., Ltd., Hachioji-Shi, Tokyo, JP;
Abstract
A probe device of the present invention measures a position of every chip in a wafer to be inspected to acquire the position as actual measurement data. Then, the probe device calculates a variation amount of an actual measurement position of each chip or a variation amount of a position at which a probe is brought into contact with the each chip of the wafer on the basis of the actual measurement data, and allows a monitor to display a range-of-variation display image that visually displays the variation amount. In the image, a quadrangular area corresponding to the each chip is displayed, and a dot is displayed in each the quadrangular area at a position shifted from a center position thereof in accordance with the variation amount.