This inventor holds 6 USPTO granted patents. Top assignee: Jeol Ltd.. Active years: 1986-1993.
Company Filing History:
Years Active: 1986-1993
Title: Kimio Ohi: Innovator in Electron Microscopy
Introduction
Kimio Ohi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electron microscopy, holding a total of 6 patents. His innovative designs have advanced the capabilities of electron microscopes, enhancing their functionality and efficiency.
Latest Patents
One of Kimio Ohi's latest patents is a detachable specimen holder for transmission electron microscopes. This side-entry specimen holder is designed to accommodate a specimen-holding plate and an insertion rod. The holder features a hole that allows the passage of the electron beam produced inside the microscope. A specimen or a piece of mesh can be held inside this hole, ensuring precise observation. Additionally, an engaging hole at one end of the holding plate allows the insertion rod to detachably hold the plate, facilitating easy specimen changes.
Another notable patent is for an electron microscope equipped with a specimen positioning device. This device enables the movement of specimen holders within a plane perpendicular to the optical axis of the electron beam. The design includes a member that extends through the side wall of the yoke of the objective lens, a preliminary chamber connected via a valve, and an exchange mechanism. This innovative setup allows for the mounting and dismounting of specimen holders, enabling the observation of multiple specimens successively once the inside of the lens is evacuated to a high vacuum.
Career Highlights
Kimio Ohi is currently employed at Jeol Ltd., a company renowned for its advanced electron microscopy technology. His work at Jeol Ltd. has positioned him as a key player in the development of cutting-edge microscopy solutions.
Collaborations
Throughout his career, Kimio Ohi has collaborated with notable colleagues, including Tohru Kasai and Yoshiyasu Harada. These collaborations have contributed to the advancement of technology in the field of electron microscopy.
Conclusion
Kimio Ohi's contributions to electron microscopy through his innovative patents and collaborations have significantly impacted the field. His work continues to inspire advancements in microscopy technology, making him a notable figure in the industry.