The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 1993

Filed:

Nov. 27, 1991
Applicant:
Inventors:

Seiichi Suzuki, Tokyo, JP;

Toru Kasai, Tokyo, JP;

Kimio Ohi, Tokyo, JP;

Assignee:

Jeol Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
25044211 ; 250311 ;
Abstract

A side-entry specimen holder for use with a transmission electron microscope. The holder comprises a specimen-holding plate and an insertion rod. The holding plate is provided with a hole permitting passage of the electron beam produced inside the microscope. Either a specimen or a piece of mesh on which a specimen is placed is held inside the hole. An engaging hole is formed at one end of the holding plate. The insertion rod has a pin at its front end. The pin is engaged in the engaging hole to detachably hold the holding plate. Thus, the insertion rod is coupled to the holding plate.


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