Ki Won Park

Title: Ki Won Park: Innovator in Inspection Technology

Introduction

Ki Won Park is a notable inventor based in Gwangmyeong-si, South Korea. He has made significant contributions to the field of inspection technology, particularly in the context of printed circuit boards. With a total of 4 patents to his name, Park continues to push the boundaries of innovation in his industry.

Latest Patents

Among his latest patents is an "Apparatus for inspecting components mounted on printed circuit board, operating method thereof, and computer-readable recording medium." This apparatus includes a processor that determines the exterior information of a first component mounted on a printed circuit board. It inspects the mounting state of the first component by utilizing inspection information from a second component, provided that the first similarity value meets a preset reference similarity value. The system updates the inspection information of multiple components based on the findings from the first and second components.

Another significant patent is the "Inspection apparatus and operating method thereof." This invention determines whether defects have occurred in a range of inspection objects by comparing measurement values against a reference range. It identifies objects with errors and adjusts the reference range based on these measurements. The apparatus also displays graphs indicating the results of defect determinations and the adjusted reference range.

Career Highlights

Ki Won Park is currently employed at Koh Young Technology Inc., a company renowned for its advanced inspection solutions. His work at Koh Young Technology has allowed him to develop innovative technologies that enhance the accuracy and efficiency of component inspections.

Collaborations

Park collaborates with talented individuals such as Dae Sung Koo and Yong Sam Kim, contributing to a dynamic team focused on advancing inspection technology.

Conclusion

Ki Won Park is a distinguished inventor whose work in inspection technology has led to multiple patents and significant advancements in the field. His contributions continue to shape the future of component inspection, demonstrating the importance of innovation in technology.