The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Feb. 13, 2018
Applicant:

Koh Young Technology Inc., Seoul, KR;

Inventors:

Seung Bum Han, Seoul, KR;

Filip Lukasz Piekniewski, San Diego, CA (US);

Dae Sung Koo, Seoul, KR;

Woo Young Lim, Goyang-si, KR;

Jin Man Kang, San Diego, CA (US);

Ki Won Park, Gwangmyeong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06N 20/00 (2019.01); G06T 7/97 (2017.01); G06T 2200/04 (2013.01); G06T 2207/30141 (2013.01);
Abstract

An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.


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