This inventor holds 6 USPTO granted patents and 1 published patent application. Top assignee: Northrop Grumman Systems Corporation. Active years: 1995-2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Monterey Park, CA (US) (1995)
- Rowland Heights, CA (US) (1995 - 2020)
Company Filing History:
Years Active: 1995-2020
Title: Kent KinMan Tam: Innovator in Fabric Conductivity Measurement
Introduction
Kent KinMan Tam is a notable inventor based in Rowland Heights, California. He has made significant contributions to the field of fabric conductivity measurement, holding a total of 6 patents. His work focuses on non-destructive testing methods that enhance production processes in various industries.
Latest Patents
One of his latest patents is an innovative system for inline fabric conductivity measurement. This non-destructive, inline, multi-channel system utilizes an array of opposing paired transmit/receive microwave horns positioned on either side of a fabric material moving along a production line. Each horn pair corresponds to a channel in the system, allowing for precise measurements of material conductivity and anisotropy. The processor-based controller manages channel hopping, frequency hopping, and measurement orientation to acquire real-time data. This information can be analyzed for defects during production, enabling manufacturers to identify and address issues promptly.
Another significant patent involves a process for determining the resistivity of a layered structure. This process includes directing electromagnetic radiation over a selected frequency range to the outer surface of the layered structure, measuring the reflection of the radiation, and analyzing the resulting signals to determine the resistance of a hidden resistive layer. This method provides valuable insights into the properties of layered materials, which can be crucial for various applications.
Career Highlights
Kent KinMan Tam is currently employed at Northrop Grumman Systems Corporation, where he continues to develop innovative solutions in his field. His expertise in fabric conductivity measurement and layered structures has positioned him as a key contributor to advancements in material testing technologies.
Collaborations
Throughout his career, Tam has collaborated with notable colleagues, including Leon Burks, Jr. and William R. Sheppard. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Kent KinMan Tam's contributions to the field of fabric conductivity measurement and layered structure analysis demonstrate his commitment to innovation. His patents reflect a deep understanding of material properties and production processes, making him a valuable asset in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile