The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 1995

Filed:

Jun. 28, 1994
Applicant:
Inventors:

Kent K Tam, Rowland Heights, CA (US);

Leon Burks, Jr, Los Angeles, CA (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342165 ; 342174 ; 342-1 ;
Abstract

A methodology for the measurement of the effectiveness of gap filler materials and treatments in radar cross section reduction uses an untreated calibration gap in a plate mounted at an acute angle so that specular reflection from radar illumination is diverted away from the horn antenna while monostatic reflection is returned to the antenna. A dielectric lens is used to focus the radar illumination in a narrow beam width so that edge effects of the plate are minimized, obviating the need for an anechoic facility. A spectral baseline is first determined using an untreated gap after which a relative quantitative test is performed on a treated gap. The antenna and horn may be mounted for motion along the gap to determine the electrical continuity of the gap treatment.


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