The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2004

Filed:

Nov. 13, 2002
Applicant:
Inventor:

Kent KinMan Tam, Rowland Heights, CA (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/732 ;
U.S. Cl.
CPC ...
G01R 2/732 ;
Abstract

A non-contact probe for determining the conductivity of coating materials is disclosed. The probe includes a free running oscillator operating at a selected frequency, a sensor made up of an LC circuit, a detector for detecting a change in the LC circuit in response to change in the sensor coil induction, and a processor for converting the detected changes in the signal to surface conductivity data. The detector may be a frequency detector that detects changes in the resonant frequency of the LC circuit or the detector may be a magnitude detector that detects changes in the signal magnitude of the LC oscillator. The sensor is the coil inductor of the LC circuit. Inductance of the sensor coil is variable depending on conductivity of the material near the sensor coil.


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