The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Mar. 22, 2017
Kent K. Tam, Rowland Heights, CA (US);
Leon Burks, Jr., Los Angeles, CA (US);
Mark D. Brown, San Pedro, CA (US);
Kent K. Tam, Rowland Heights, CA (US);
Leon Burks, Jr., Los Angeles, CA (US);
Mark D. Brown, San Pedro, CA (US);
NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);
Abstract
A non-destructive, inline, multi-channel fabric conductivity measurement system uses an array of opposing paired transmit/receive microwave horns on opposite sides of a fabric material moving in a production line, each horn pair corresponding to a channel in the system. A processor-based controller can control channel hopping, frequency hopping, and measurement orientation to acquire measurements of material conductivity and anisotropy, which measurements can be analyzed for defects that can be flagged in real time during production. Measurements and/or analyses can be stored to make roll-to-roll, batch-to-batch, day-to-day, or production-phase-to-production-phase comparisons useful in identifying the sources of production problems and/or the causes of corrections.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile