Tama, Japan

Keikichi Yagii


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 9(Granted Patents)


Location History:

  • Tokyo, JP (1986)
  • Tama, JP (1995 - 2001)

Company Filing History:


Years Active: 1986-2001

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4 patents (USPTO):Explore Patents

Title: Keikichi Yagii: Innovator in Printed Board Inspection Technology

Introduction

Keikichi Yagii is a notable inventor based in Tama, Japan. He has made significant contributions to the field of printed board inspection technology. With a total of 4 patents to his name, Yagii's work has advanced the methods and apparatus used in the inspection of printed boards.

Latest Patents

Yagii's latest patents include an inspection adapter board for printed boards, a method for inspecting printed boards, and a method and apparatus for producing information for fabricating the inspection adapter board. His invention provides an inspection adapter board that features inspection electrodes with a pitch wider than the electrodes being inspected. This design allows for necessary inspections to be conducted by testers with small capacities, facilitating ease of design and fabrication. Additionally, he has developed a process for inspecting electrodes using rotation alignment correction, which involves a rough alignment between the plate to be inspected and a standard inspecting plate, followed by a mathematical analysis of the position deviation.

Career Highlights

Throughout his career, Yagii has worked with prominent companies such as Japan Synthetic Rubber Co., Ltd. and Pioneer Electronic Corporation. His experience in these organizations has contributed to his expertise in the field of electronic inspection technologies.

Collaborations

Yagii has collaborated with notable coworkers, including Yuichi Haruta and Hiroshi Kato. Their collective efforts have furthered advancements in the technologies related to printed board inspection.

Conclusion

Keikichi Yagii's innovative contributions to printed board inspection technology have established him as a key figure in the field. His patents reflect a commitment to improving inspection methods and apparatus, showcasing his expertise and dedication to innovation.

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