The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1995

Filed:

Jan. 26, 1993
Applicant:
Inventors:

Kiyoshi Kimura, Chiba, JP;

Yuiti Haruta, Yokohama, JP;

Keikichi Yagii, Tama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324758 ;
Abstract

A method for the inspection of a circuit board, capable of precisely detecting deviation in position between the electrodes to be inspected of a circuit board and the inspection electrodes of a tester, thereby achieving fine alignment between the two, with high reliability. The method includes repeating, in two different axial directions, the measurement of conduction state between the electrodes to be inspected of a circuit board and the inspection electrodes of a tester each time changing, by a small distance, the relative position of the inspection electrodes portion of the tester and the circuit board, to detect a position of high conduction state and two positions of low conduction state which are distant from the position and located so that the position is held between them, in each of the two directions. From the information thus obtained, determining the desired connection position in which the inspection electrodes are to be in the highest conduction state in relation to the electrodes to be inspected in one or both of the directions. And then, moving the inspection electrodes portion relatively to the circuit board to place the inspection electrodes in the desired connection position.


Find Patent Forward Citations

Kimura, Kiyoshi. (1995). Method for the inspection of circuit board (U.S. Patent No. 5381104). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5381104

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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